Lines Matching +full:scan +full:- +full:delay

1 /* SPDX-License-Identifier: GPL-2.0-only */
8  * DOC: In-Field Scan
11  * In-Field Scan
15  * ------------
17  * In Field Scan (IFS) is a hardware feature to run circuit level tests on
20  * with a new platform-device instance-id.
24  * ---------
26  * Intel provides firmware files containing the scan tests via the webpage [#f1]_.
27  * Look under "In-Field Scan Test Images Download" section towards the
29  * family-model-stepping. IFS Images are not applicable for some test types.
36  * -----------------
46  * ff-mm-ss-01.scan
47  * ff-mm-ss-02.scan
48  * ff-mm-ss-03.scan
53  * To load ff-mm-ss-02.scan, the following command can be used::
60  * -------------
114  * +------+--------------------+
116  * +------+--------------------+
118  * +------+--------------------+
121  * ---------------------
131  * -------------------------------------------------
134  * coverage complementing Scan at Field (SAF) testing. SBAF mimics the
141  * seamlessly resets to its pre-test state and resumes normal operation.
146  * and each batch test can take hundreds of milliseconds (100-200 ms) to
148  * recommended to relocate the time-sensitive applications to other cores.
249 		u32	delay	:31;  member
295 		u32	delay		:31;  member
316  * Driver populated error-codes
318  * 0xFE: not all scan chunks were executed. Maximum forward progress retries exceeded.
332  * struct ifs_test_msrs - MSRs used in IFS tests
348  * struct ifs_data - attributes related to intel IFS driver
354  * @scan_details: opaque scan status code from h/w
392 	return &d->rw_data;  in ifs_get_data()
400 	return d->test_caps;  in ifs_get_test_caps()
408 	return d->test_msrs;  in ifs_get_test_msrs()